Structural characterization of CuInS2 thin films from Cu-In metal inks

✍ Scribed by Chen, Guanbi ;Wang, Lei ;Sheng, Xia ;Chang, Lantao ;Luo, Yeping ;Yang, Deren

• Book ID: 105366347
• Publisher: John Wiley and Sons
• Year: 2011
• Tongue: English
• Weight: 955 KB
• Volume: 208
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.201026782

✦ Synopsis

Abstract

We report the structural characterization of CuInS~2~ thin films based on Cu–In metal inks. CuInS~2~ films from the precursor films with different Cu/In ratios were sulfurized and investigated by SEM, XRD, Raman, and XPS. Morphological and compositional changes before and after etching of CuS impurity phase were also compared. By ex situ characterization of the CuInS~2~ films sulfurized at different temperatures, an established mechanism is proposed to explain the sulfurization process. The sulfurization is a diffusion‐limited process, in which the diffusion rate differences of Cu and In control the intermediate phases. Moreover, the Cu/In ratio and sulfurization temperature determine the morphological and structural qualities of the CuInS~2~ films.