## Abstract We report the structural characterization of CuInS~2~ thin films based on CuβIn metal inks. CuInS~2~ films from the precursor films with different Cu/In ratios were sulfurized and investigated by SEM, XRD, Raman, and XPS. Morphological and compositional changes before and after etching
β¦ LIBER β¦
Dependence of Cu/In ratio of structural and electrical characterization of CuInS2crystal
β Scribed by K. Yoshino; K. Nomoto; A. Kinoshita; T. Ikari; Y. Akaki; T. Yoshitake
- Book ID
- 106397806
- Publisher
- Springer US
- Year
- 2007
- Tongue
- English
- Weight
- 195 KB
- Volume
- 19
- Category
- Article
- ISSN
- 0957-4522
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