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Structural characterization of cubic and hexagonal GaN thin films grown by IBA–MBE on SiC/Si

✍ Scribed by M. Häberlen; J.W. Gerlach; B. Murphy; J.K.N. Lindner; B. Stritzker

Book ID: 108166025
Publisher: Elsevier Science
Year: 2010
Tongue: English
Weight: 809 KB
Volume: 312
Category: Article
ISSN: 0022-0248
DOI: 10.1016/j.jcrysgro.2009.12.048

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