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Structural Characterization of CeO 2 −MO 2 (M = Si 4+ , Ti 4+ , and Zr 4+ ) Mixed Oxides by Raman Spectroscopy, X-ray Photoelectron Spectroscopy, and Other Techniques

✍ Scribed by Reddy, Benjaram M.; Khan, Ataullah; Yamada, Yusuke; Kobayashi, Tetsuhiko; Loridant, Stéphane; Volta, Jean-Claude

No coin nor oath required. For personal study only.

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