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Structural Characterization and Thermal Stability of MoS 2 Intercalation Compounds

โœ Scribed by Dungey, Keenan E.; Curtis, M. David; Penner-Hahn, James E.

Book ID
120226173
Publisher
American Chemical Society
Year
1998
Tongue
English
Weight
401 KB
Volume
10
Category
Article
ISSN
0897-4756

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2H-MoS2 is a semiconductor with a hexagonal layered structure. Each Mo atom is prismatically coordinated by six S atoms. Our in situ X-ray diffraction results indicate that, upon intercalation, the MoS2 host lattice undergoes a first order phase transition in which the Mo coordination changes from t