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Structural characteristics of SiGe/Si materials investigated by raman spectroscopy

✍ Scribed by ChangChun Chen; BenHai Yu; Jiangfeng Liu; QiRun Dai

Publisher: TechnoPress
Year: 2005
Tongue: English
Weight: 511 KB
Volume: 11
Category: Article
ISSN: 1598-9623
DOI: 10.1007/bf03027329

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