Structural changes in amorphous silicon studied by X-ray photoemission spectroscopy: a phenomenon independent of the Staebler–Wronski effect?

✍ Scribed by Shuran Sheng; Edward Sacher; Arthur Yelon

• Book ID: 117144836
• Publisher: Elsevier Science
• Year: 2001
• Tongue: English
• Weight: 354 KB
• Volume: 282
• Category: Article
• ISSN: 0022-3093
• DOI: 10.1016/s0022-3093(01)00339-8