Irradiation-induced structural changes in hydrogenated amorphous silicon as measured by X-ray photoemission spectroscopy

✍ Scribed by A. Yelon; A. Rochefort; S. Sheng; E. Sacher

• Book ID: 108472441
• Publisher: Elsevier Science
• Year: 2003
• Tongue: English
• Weight: 113 KB
• Volume: 78
• Category: Article
• ISSN: 0927-0248
• DOI: 10.1016/s0927-0248(02)00444-0