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Structural and optical characterization of Sn incorporation in CuInS2 thin films grown by vacuum evaporation method

✍ Scribed by M. Ben Rabeh; M. Zribi; M. Kanzari; B. Rezig

Book ID
113789025
Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
279 KB
Volume
59
Category
Article
ISSN
0167-577X

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## Abstract Thermally processed lead iodide (PbI~2~) thin films were prepared by the vacuum evaporation method in a constant ambient. Measured thickness of the film was verified analytically from the optical transmittance data in a wavelength range between 300 and 1600 nm. From the Tauc relation fo