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Structural and electrical characterization of AgInS2thin films grown by single-source thermal evaporation method

✍ Scribed by Y. Akaki; S. Kurihara; M. Shirahama; K. Tsurugida; T. Kakeno; K. Yoshino

Publisher
Springer US
Year
2005
Tongue
English
Weight
636 KB
Volume
16
Category
Article
ISSN
0957-4522

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## Abstract Two‐source thermal evaporation technique was used to prepare Hg~x~Cd~1‐x~Te thin films onto scratch free transparent glass substrates. The structural investigations revealed that thin films were polycrystalline in nature. Transmittance measurements in the wavelength range (500‐2700 nm)