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Structural and electrical properties of Ti-Al thin films

✍ Scribed by Anna Górecka-Drzazga; Zbigniew Ziołowski


Publisher
Elsevier Science
Year
1979
Tongue
English
Weight
269 KB
Volume
62
Category
Article
ISSN
0040-6090

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Electrical properties of Al-CeO2-Al thin
✍ Dr. M. Chandra Shekar; Dr. V. Hari Babu 📂 Article 📅 1984 🏛 John Wiley and Sons 🌐 English ⚖ 352 KB 👁 1 views

Ceriutii Oxide films were prepared by vaciiurii therinal evaporation from tantaluni hoat i n a conventional vacuum coating unit. Current-voltage characteristics were studied for different filni thicknesses. The breakdown voltage ( VB) arid dielectric field strength ( E B ) were calculated. It is fbu