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Structural analysis of SiO2gel films by high energy electron diffraction

โœ Scribed by H. Ohsaki; K. Miura; A. Imai; M. Tada; M. A. Aegerter


Book ID
104785289
Publisher
Springer
Year
1994
Tongue
English
Weight
447 KB
Volume
2
Category
Article
ISSN
0928-0707

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