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Structural analysis of amorphous thin films by time of flight mass spectrometry

✍ Scribed by Seiji Tsuboi; Mitsutaka Matsuse; Masashi Kawasaki; Akihisa Matsuda; Hideomi Koinuma

Book ID: 115990836
Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 281 KB
Volume: 198-200
Category: Article
ISSN: 0022-3093
DOI: 10.1016/0022-3093(95)00650-8

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