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Stresses in thin films: The relevance of grain boundaries and impurities

✍ Scribed by R.W. Hoffman

Publisher: Elsevier Science
Year: 1976
Tongue: English
Weight: 333 KB
Volume: 34
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(76)90453-3

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