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Stress in thin dielectric films : D. S. Campbell, Electronics Reliability and Microminiaturization, Vol. 2 1963, pp. 207–213

Book ID: 113189754
Publisher: Elsevier Science
Year: 1964
Tongue: English
Weight: 196 KB
Volume: 3
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(64)90057-5

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📂 Article 📅 1964 🏛 Elsevier Science 🌐 English ⚖ 100 KB