A survey of methods of measuring thin film thicknesses and surface irregularities : P. Wright, Electronics Reliability and Microminiaturization, Vol. 2, 1963, pp. 227–233

• Book ID: 113189755
• Publisher: Elsevier Science
• Year: 1964
• Tongue: English
• Weight: 100 KB
• Volume: 3
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(64)90058-7