527. A survey of methods of measuring thin film thicknesses and surface irregularities: P. Wright, Electronic Reliab. Micromin., 2, Dec. 1963, 227–233

• Book ID: 103447880
• Publisher: Elsevier Science
• Year: 1964
• Tongue: English
• Weight: 74 KB
• Volume: 14
• Category: Article
• ISSN: 0042-207X
• DOI: 10.1016/0042-207x(64)90955-8