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Stress-driven migration of simple low-angle mixed grain boundaries

✍ Scribed by A.T. Lim; M. Haataja; W. Cai; D.J. Srolovitz

Book ID
113415917
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
559 KB
Volume
60
Category
Article
ISSN
1359-6454

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πŸ“œ SIMILAR VOLUMES

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We investigated the migration of a symmetric tilt, low-angle grain boundary (LAGB) under applied shear stress in the presence of extrinsic dislocations. The results demonstrate that there is a threshold stress for the LAGB to depin from extrinsic dislocations. Below the threshold stress, the LAGB re

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Stress-induced migration of planar grain boundaries in aluminum bicrystals was measured for both low-and high-angle symmetrical h1 0 0i tilt grain boundaries across the entire misorientation range (0-90Β°). Boundary migration under a shear stress was observed to be coupled to a lateral translation of