✦ LIBER ✦
The dislocations of low-angle grain boundaries in GaN epilayers: a HRTEM quantitative study and finite element stress state calculation
✍ Scribed by Kret, S.; Dluzewski, P.; Maciejewski, G.; Potin, V.; Chen, J.; Ruterana, P.; Nouet, G.
- Book ID
- 122090095
- Publisher
- Elsevier Science
- Year
- 2002
- Tongue
- English
- Weight
- 791 KB
- Volume
- 11
- Category
- Article
- ISSN
- 0925-9635
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