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Stress and microstructure in YBaCuO thin films on MgO and SrTiO3 substrates studied by X-ray diffraction and bending tests

✍ Scribed by S. Auzary; F. Badawi; L. Bimbault; J. Rabier; R.J. Gaboriaud

Book ID: 117623494
Publisher: Elsevier Science
Year: 1997
Tongue: English
Weight: 566 KB
Volume: 251
Category: Article
ISSN: 0925-8388
DOI: 10.1016/s0925-8388(96)02767-3

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