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NdF3 thin films grown on carbon substrates and analyzed by RBS, PIXE, RNRA, SEM and X-ray diffraction

✍ Scribed by A. Oliver; P. Castellanos; J. Miranda; J.L. Ruvalcaba; E. Andrade

Book ID: 113284020
Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 256 KB
Volume: 79
Category: Article
ISSN: 0168-583X
DOI: 10.1016/0168-583x(93)95391-h

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## Abstract Nanocomposite thin films composed by (BaTiO~3~)~1–__x__~ –(CoFe~2~O~4~)__~x~__ with different cobalt ferrite concentrations (__x__) have been deposited by pulsed laser ablation on platinum covered Si(001) substrates. The films structure was studied by X‐ray diffraction and Raman spectro