Strained Quantum Well InAs Micro-Hall Sensors: Dependence of Device Performance on Channel Thickness

✍ Scribed by Dobbert, J.; Kunets, V.P.; Morgan, T.A.; Guzun, D.; Mazur, Y.I.; Masselink, W.T.; Salamo, G.J.

• Book ID: 114619091
• Publisher: IEEE
• Year: 2008
• Tongue: English
• Weight: 340 KB
• Volume: 55
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2007.913000