Strained Quantum Well InAs Micro-Hall Se
Strained Quantum Well InAs Micro-Hall Sensors: Dependence of Device Performance on Channel Thickness
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Dobbert, J.; Kunets, V.P.; Morgan, T.A.; Guzun, D.; Mazur, Y.I.; Masselink, W.T.
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Article
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2008
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IEEE
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English
โ 340 KB