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Strain Measurements of Silicon Dioxide Microspecimens by Digital Imaging Processing

โœ Scribed by W. N. Sharpe; J. Pulskamp; D. S. Gianola; C. Eberl; R. G. Polcawich; R. J. Thompson

Book ID
106574142
Publisher
Sage Publications
Year
2007
Tongue
English
Weight
664 KB
Volume
47
Category
Article
ISSN
0014-4851

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