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Strain mapping around dislocations in diamond and cBN

✍ Scribed by Willems, B. ;Nistor, L. C. ;Ghica, C. ;Van Tendeloo, G.

Publisher
John Wiley and Sons
Year
2005
Tongue
English
Weight
438 KB
Volume
202
Category
Article
ISSN
0031-8965

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✦ Synopsis

Abstract

Strain fields around dislocations in diamond and cBN have been quantitatively characterized at a sub nanometer scale. The combination of experimental high resolution electron microscopy (HREM) and image analysis using the geometric phase method provides an accurate determination of the local deformations and strain. The results of the strain analysis of the 60Β° perfect dislocation in diamond and cBN are discussed. (Β© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

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