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Strain energy imaging of a power MOS transistor using speckle interferometry

✍ Scribed by Dilhaire, S.; Grauby, S.; Jorez, S.; Claeys, W.


Book ID
114668279
Publisher
IEEE
Year
2004
Tongue
English
Weight
169 KB
Volume
53
Category
Article
ISSN
0018-9529

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