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Strain and Shape of Epitaxial InAs/InP Nanowire Superlattice Measured by Grazing Incidence X-ray Techniques

✍ Scribed by Eymery, Joël; Rieutord, François; Favre-Nicolin, Vincent; Robach, Odile; Niquet, Yann-Michel; Fröberg, Linus; Mårtensson, Thomas; Samuelson, Lars


Book ID
120509445
Publisher
American Chemical Society
Year
2007
Tongue
English
Weight
468 KB
Volume
7
Category
Article
ISSN
1530-6984

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