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Depth-resolved measurement of lattice relaxation in Ga1âxInxAs/GaAs strained layer superlattices by means of grazing-incidence x-ray diffraction

✍ Scribed by Pietsch, U.; Metzger, H.; Rugel, S.; Jenichen, B.; Robinson, I. K.

No coin nor oath required. For personal study only.

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Depth-resolved measurement of lattice relaxation in Ga1âxInxAs/GaAs strained layer superlattices by means of grazing-incidence x-ray diffraction