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Strain and critical layer thickness analysis of carbon-doped GaAs

✍ Scribed by Seong-Il Kim; Moo-Sung Kim; Suk-Ki Min

Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 399 KB
Volume: 97
Category: Article
ISSN: 0038-1098
DOI: 10.1016/0038-1098(95)00671-0

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