Stochastic analysis of temperature spikes contribution towards the damage in a component exposed to nuclear radiation environment : Krishan Lal. Microelectron. Reliab. 18, 281 (1978)

• Publisher: Elsevier Science
• Year: 1979
• Tongue: English
• Weight: 249 KB
• Volume: 19
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(79)90186-0