Probability of displacement damage in a component exposed to nuclear radiation stress from the viewpoint of reliability : Krishan Lal. Microelectron. Reliab.17, 435 (1978)

• Publisher: Elsevier Science
• Year: 1978
• Tongue: English
• Weight: 124 KB
• Volume: 18
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(78)90017-3