A stereo vision system for the inspectio
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Q. Z. Ye; S. H. Ong; X. Han
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Article
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2000
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John Wiley and Sons
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English
β 199 KB
## Abstract We describe a novel inspection system based on the application of the stereo technique to the detection of defects related to the threeβdimensional (3D) profile of IC wire bonds. In our singleβcameraβbased setup, stereo views are obtained by rotating the IC chip under the CCD camera wit