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Step-Edge Josephson Junctions on Multilayered High Temperature Superconducting Thin Film

โœ Scribed by Shcherbakova, Olga V.; Lam, Simon K. H.; Pan, Alexey V.; Fedoseev, Sergey V.; Dou, Shi X.; Du, Jia; Foley, Cathy P.

Book ID
118177248
Publisher
IEEE
Year
2011
Tongue
English
Weight
659 KB
Volume
21
Category
Article
ISSN
1051-8223

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๐Ÿ“œ SIMILAR VOLUMES

Low-temperature scanning electron micros
Low-temperature scanning electron microscopy studies of superconducting thin films and Josephson junctions
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The invited talk was given by R. Gross. Scanning techniques represent powerful methods for the characterization of condensed matter. Extending Scanning Electron Microscopy (SEM) to the range of low temperatures an interesting tool for studying low-temperature properties of solids with high-spatial a