Statistical Simulation of Progressive NBTI Degradation in a 45-nm Technology pMOSFET

✍ Scribed by Brown, A.R.; Huard, V.; Asenov, A.

• Book ID: 114620075
• Publisher: IEEE
• Year: 2010
• Tongue: English
• Weight: 635 KB
• Volume: 57
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2010.2052694