Quantitative Evaluation of Statistical Variability Sources in a 45-nm Technological Node LP N-MOSFET

✍ Scribed by Cathignol, A.; Cheng, B.; Chanemougame, D.; Brown, A.R.; Rochereau, K.; Ghibaudo, G.; Asenov, A.

• Book ID: 115543245
• Publisher: IEEE
• Year: 2008
• Tongue: English
• Weight: 352 KB
• Volume: 29
• Category: Article
• ISSN: 0741-3106
• DOI: 10.1109/led.2008.922978