Statistical performance analysis and modeling techniques for nanometer VLSI designs

✍ Scribed by Ruijing Shen, Sheldon X.-D. Tan, Hao Yu (auth.)

• Publisher: Springer-Verlag New York
• Year: 2012
• Tongue: English
• Leaves: 325
• Edition: 1
• Category: Library

✦ Synopsis

Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have become imperative for the successful design of VLSI chips.

This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in the presence of process variations at the nanometer scale. It presents the latest developments for modeling and analysis, with a focus on statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and dynamic power analysis considering spatial correlations, statistical analysis and modeling for large global interconnects and analog/mixed-signal circuits.

• Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits;
• Helps chip designers understand the potential and limitations of their design tools, improving their design productivity;
• Presents analysis of each algorithm with practical applications in the context of real circuit design;
• Includes numerical examples for the quantitative analysis and evaluation of algorithms presented.

• Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits;
• Helps chip designers understand the potential and limitations of their design tools, improving their design productivity;
• Presents analysis of each algorithm with practical applications in the context of real circuit design;
• Includes numerical examples for the quantitative analysis and evaluation of algorithms presented.

✦ Table of Contents

Front Matter....Pages i-xxix
Front Matter....Pages 1-1
Introduction....Pages 3-14
Fundamentals of Statistical Analysis....Pages 15-36
Front Matter....Pages 37-37
Traditional Statistical Leakage Power Analysis Methods....Pages 39-54
Statistical Leakage Power Analysis by Spectral Stochastic Method....Pages 55-63
Linear Statistical Leakage Analysis by Virtual Grid-Based Modeling....Pages 65-82
Statistical Dynamic Power Estimation Techniques....Pages 83-92
Statistical Total Power Estimation Techniques....Pages 93-103
Front Matter....Pages 105-105
Statistical Power Grid Analysis Considering Log-Normal Leakage Current Variations....Pages 107-126
Statistical Power Grid Analysis by Stochastic Extended Krylov Subspace Method....Pages 127-144
Statistical Power Grid Analysis by Variational Subspace Method....Pages 145-159
Front Matter....Pages 161-161
Statistical Capacitance Modeling and Extraction....Pages 163-182
Incremental Extraction of Variational Capacitance....Pages 183-208
Statistical Inductance Modeling and Extraction....Pages 209-218
Front Matter....Pages 219-219
Performance Bound Analysis of Variational Linearized Analog Circuits....Pages 221-233
Stochastic Analog Mismatch Analysis....Pages 235-252
Statistical Yield Analysis and Optimization....Pages 253-272
Voltage Binning Technique for Yield Optimization....Pages 273-286
Back Matter....Pages 287-305

✦ Subjects

Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design; Nanotechnology and Microengineering