Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

✍ Scribed by Ruijing Shen

Publisher: Not Avail
Year: 2014
Tongue: English
Leaves: 325
Category: Library

⬇ Acquire This Volume

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Statistical performance analysis and mod

📁 Statistical performance analysis and modeling techniques for nanometer VLSI designs

✍ Ruijing Shen, Sheldon X.-D. Tan, Hao Yu (auth.) 📂 Library 📅 2012 🏛 Springer-Verlag New York 🌐 English

<p><p>Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have become imperative for the successful des

Long-Term Reliability of Nanometer VLSI

📁 Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization

✍ Sheldon Tan, Mehdi Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun, Saman Kiame 📂 Library 📅 2019 🏛 Springer International Publishing 🌐 English

<p>This book provides readers with a detailed reference regarding two of the most important long-term reliability and aging effects on nanometer integrated systems, electromigrations (EM) for interconnect and biased temperature instability (BTI) for CMOS devices. The authors discuss in detail recent

Long-Term Reliability of Nanometer VLSI

📁 Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization

✍ Sheldon Tan, Mehdi Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun, Saman Kiame 📂 Library 📅 2019 🏛 Springer 🌐 English

This book provides readers with a detailed reference regarding two of the most important long-term reliability and aging effects on nanometer integrated systems, electromigrations (EM) for interconnect and biased temperature instability (BTI) for CMOS devices. The authors discuss in detail recent d

Statistical Modeling for Computer-Aided

📁 Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits

✍ Christopher Michael, Mohammed Ismail 📂 Library 📅 1993 🏛 Springer 🌐 English

As MOS devices are scaled to meet increasingly demanding circuit specifications, process variations have a greater effect on the reliability of circuit performance. For this reason, statistical techniques are required to design integrated circuits with maximum yield. <em>Statistical Modeling fo

The Art of Computer Systems Performance

📁 The Art of Computer Systems Performance Analysis: Techniques for Experimental Design, Measurement, Simulation, and Modeling

✍ R. K. Jain 📂 Library 📅 1991 🏛 Wiley 🌐 English

The Art of Computer Systems Performance Analysis "At last, a welcome and needed text for computer professionals who require practical, ready-to-apply techniques for performance analysis. Highly recommended!" -Dr. Leonard Kleinrock University of California, Los Angeles "An entirely refreshing text wh

The Art of Computer Systems Performance

📁 The Art of Computer Systems Performance Analysis: Techniques for Experimental Design, Measurement, Simulation, and Modeling

✍ Raj K. Jain 📂 Library 📅 1991 🌐 English