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Statistical features of the avalanche multiplication build-up in semiconductors with different coefficients of impact ionization

✍ Scribed by A. V. Verkhovtseva; I. V. Vanyushin; V. A. Gergel’; A. P. Zelenyi; V. A. Zimoglyad; Yu. I. Tishin

Book ID
111451938
Publisher
SP MAIK Nauka/Interperiodica
Year
2009
Tongue
English
Weight
238 KB
Volume
54
Category
Article
ISSN
1064-2269

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