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Stacking-Fault Based Microscopic Model for Platelets in Diamond

✍ Scribed by Miranda, C. R.; Antonelli, A.; Nunes, R. W.


Book ID
121450837
Publisher
The American Physical Society
Year
2004
Tongue
English
Weight
369 KB
Volume
93
Category
Article
ISSN
0031-9007

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## Abstract In this paper, we present a method for detecting faults that can appear in some parts of a chemical plant. This method is based on statistical information generated by the Extended Kalman Filter (EKF) technique and is designed to reveal any drift from the normal behavior of the process.