A Technique for Determining the Number of Adjacent Intrinsic Faults in Multi-Layered Stacking Fault Configurations Using Complementary Strong and Weak Beam Electron Microscope Images

✍ Scribed by Kim, H. S. ;Sheinin, S. S.

• Publisher: John Wiley and Sons
• Year: 1997
• Tongue: English
• Weight: 235 KB
• Volume: 161
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/1521-396x(199706)161:2<335::aid-pssa335>3.0.co;2-x