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Stability of lamellar microstructure of hard orientated PST crystal of TiAl alloy

✍ Scribed by H.Y. Kim; K. Maruyama


Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
1015 KB
Volume
51
Category
Article
ISSN
1359-6454

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Parallel twinning during creep deformati
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Compression creep tests were conducted in the soft orientation PST TiAl crystals under the constant stress condition with applied stress of 100-316 MPa at 1150 K to investigate the effect of parallel twinning on creep deformation behavior. The effect of applied stress and strain on parallel twinning