Thin YBa 2 Cu 3 O x (YBCO) films were deposited using DC-sputtering technique on NdGaO 3 substrates, tilted from (1 1 0) orientation by 0-26°. The structure and surface quality of the substrates were carefully characterized to obtain reliable results of thin films deposition. Structural, morphologic
Sputter deposition of epitaxial Y1Ba2Cu3Ox-films on SrTiO3, MgO, LaAlO3, NdGaO3 and YSZ/sapphire substrates
✍ Scribed by O. Gieres; H. Schmidt; K. Hradil; W. Hösler; R. Seeböck
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 260 KB
- Volume
- 185-189
- Category
- Article
- ISSN
- 0921-4534
No coin nor oath required. For personal study only.
✦ Synopsis
Thin films of Y1Ba2Cu30~have been prepared by sputter deposition. The sputter parameters like gas pressure, gas mixture, distance target-substrate and deposition temperature h.ave been varied in oroer to find optimum contritions tor, epitaxi~l film growth. Witl~ optimum conditions Te > 90 K and critical current densities Jc > 5 *10 ° A/cm" couldbe achieved on standard substrateslike SrTiO~, LaAIO-~, MgO and NifGaO 3. On sapphire substrates with an llF-spul~tered epitaxial buffer'layer of YSZ the YBCO films reachedT c > 90 K and Jc > 2 *10 ° A/cm z at 77 K.
📜 SIMILAR VOLUMES
The heteroepitaxy in DyMnO3/ErtBa2Cu3OT\_s bilayer thin films on LaAIO3 (100) substrates was characterized by four-circle X-ray diffractometry. The ErtBa2Cu3OT\_6 thin films on LaAIO3 (100) substrates were prepared by molecular-beam deposition (MBD) and post-growth annealing in wet and dry 02 at 880