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[Springer Proceedings in Physics] Microscopy of Semiconducting Materials Volume 107 || A TEM Study of A1N Interlayer Defects in AlGaN/GaN Heterostructures

✍ Scribed by Cullis, A. G.; Hutchison, J. L.

Book ID: 124151944
Publisher: Springer Berlin Heidelberg
Year: 2005
Weight: 233 KB
Category: Article
ISBN: 354031914X
DOI: 10.1007/3-540-31915-8_10

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