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[Springer Proceedings in Physics] Microscopy of Semiconducting Materials Volume 107 || The electric field and dopant distribution in p-i-n structures observed by ionisation potential (dopant contrast) microscopy in the HRSEM
✍ Scribed by Cullis, A. G.; Hutchison, J. L.
- Book ID
- 124168865
- Publisher
- Springer Berlin Heidelberg
- Year
- 2005
- Weight
- 332 KB
- Category
- Article
- ISBN
- 354031914X
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