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[Springer Proceedings in Physics] Microscopy of Semiconducting Materials 2007 Volume 120 || Three-Dimensional Field Models for Reverse Biased P-N Junctions

✍ Scribed by Cullis, A. G.; Midgley, P. A.

Book ID: 120193999
Publisher: Springer Netherlands
Year: 2008
Weight: 787 KB
Category: Article
ISBN: 1402086156
DOI: 10.1007/978-1-4020-8615-1_82

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