𝔖 Bobbio Scriptorium
✦   LIBER   ✦

SPM imaging probe


Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
283 KB
Volume
8
Category
Article
ISSN
1369-7021

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πŸ“œ SIMILAR VOLUMES


Imaging probe for SPM
πŸ“‚ Article πŸ“… 2005 πŸ› Elsevier Science 🌐 English βš– 103 KB
Scanning Probe Microscope Control : New
✍ Peter Spizig πŸ“‚ Article πŸ“… 2007 πŸ› Wiley (John Wiley & Sons) βš– 775 KB

Controlling the latest Scanning Probe Microscopes (SPMs) demand highly sophisticated electronics. This is apparent when considering even relatively simple operational procedures such as the tip approach of an Atomic Force Microscope (AFM): The controller must lower the tip towards the sample surface

Micromachined SPM probes with sub-100 nm
✍ SchΓΌrmann, G.; IndermΓΌhle, P. F.; Staufer, U.; de Rooij, N. F. πŸ“‚ Article πŸ“… 1999 πŸ› John Wiley and Sons 🌐 English βš– 245 KB

We have developed a fabrication process that allows thin Ðlms to be patterned at the end of a sharp tip. Using this method, many di †erent material contrasts can be achieved on the apex of a scanning probe microscope tip. For example, small apertures down to 30 nm have been patterned into an alumini