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Spin dependence of inter-edge-channel scattering in Si-MOSFETs in the quantum Hall regime

✍ Scribed by P.C. van Son; S.L. Wang; T.M. Klapwijk

Book ID: 118365010
Publisher: Elsevier Science
Year: 1992
Tongue: English
Weight: 297 KB
Volume: 263
Category: Article
ISSN: 0039-6028
DOI: 10.1016/0039-6028(92)90353-8

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