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SPIE Proceedings [SPIE Symposium on Integrated Optoelectronics - San Jose, CA (Thursday 20 January 2000)] Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V - Accuracy enhancement of point triangulation probes for linear displacement measurement

✍ Scribed by Kim, Kyung-Chan; Kim, Jong-Ahn; Oh, SeBaek; Kim, Soo Hyun; Kwak, Yoon Keun; Burnham, Geoffrey T.; He, Xiaoguang; Linden, Kurt J.; Wang, S. C.

Book ID: 120383776
Publisher: SPIE
Year: 2000
Weight: 312 KB
Volume: 3945
Category: Article
DOI: 10.1117/12.380524

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