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SPIE Proceedings [SPIE Symposium on Integrated Optoelectronics - San Jose, CA (Thursday 20 January 2000)] Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V - Raman probe of new laser materials GaAs1-xBixand InAs1-xBix

✍ Scribed by Verma, Prabhat; Herms, Martin; Irmer, Gert; Yamada, Masayoshi; Okamoto, Hiroshi; Oe, Kunishige; Burnham, Geoffrey T.; He, Xiaoguang; Linden, Kurt J.; Wang, S. C.

Book ID: 118010476
Publisher: SPIE
Year: 2000
Weight: 213 KB
Volume: 3945
Category: Article
DOI: 10.1117/12.380534

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✍ Lamela, Horacio; Santos, Jose I.; Burnham, Geoffrey T.; He, Xiaoguang; Linden, K 📂 Article 📅 2000 🏛 SPIE ⚖ 200 KB