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SPIE Proceedings [SPIE Symposium on Integrated Optoelectronic Devices - San Jose, CA (Friday 18 January 2002)] Test and Measurement Applications of Optoelectronic Devices - Beam shaping of broad-area diode lasers: principles and benefits

✍ Scribed by Pfeil, Albrecht v.; von Freyhold, Thilo; Chin, Aland K.; Dutta, Niloy K.; Herrick, Robert W.; Linden, Kurt J.; McGraw, Daniel J.

Book ID: 120459612
Publisher: SPIE
Year: 2002
Weight: 1000 KB
Volume: 4648
Category: Article
DOI: 10.1117/12.462645

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